Dynamic process for adaptive tests

ABSTRACT

A method for modifying the execution sequence of tests for testing an object on a test system. The tests include a group of tests that is a candidate for replacement. The method includes: while executing the tests according to the execution sequence and before executing the group of tests, modifying, in real time, the execution sequence including: executing a delay instead of the group of tests, wherein the delay is related to the group of tests.

TECHNOLOGICAL FIELD

The present invention is in the field of Dynamic Processes for AdaptiveTests (AT).

BACKGROUND OF THE INVENTION

Adaptive Test (AT) is a broad term used to describe methods that changetest conditions, test flow, test content and test limits based onmanufacturing test data and statistical data analysis. AT has beenidentified as an important test process and methodology change needed toachieve lower test costs, using the most recent release of theInternational Technology Roadmap for Semiconductors (ITRShttp://www.itrs.net/). The term AT is not limited to semiconductors andcan be applied to testing of other types of devices.

Attention is first drawn to FIG. 1 illustrating a generalized testsystem in accordance with the prior art.

FIG. 1 shows tests 351 (in the example of FIGS. 1 T11 to T42) within atest flow 300 of tests accommodated in a test program 250. The tests mayinclude group(s) of tests each containing a single test or multipletests. The sequence in which the tests are executed, also known as anexecution sequence of tests 400, may be determined, in real-time, by theoperating system (OS) of the test system 200 at least in part based onthe test flow 300. A sequence of operations in accordance with the priorart is shown in FIG. 7. During real-time AT based on manufacturing testdata and/or statistical data analysis certain group(s) of tests(hereinafter group of tests that are candidates for removal) may beremoved from the execution sequence, and are sometimes also referred toas bypassed, skipped or disabled groups. Such group(s) of tests that areremoved from the execution sequence are not executed by the test system.

Dynamically modifying the execution sequence of tests on a test system(100) based on manufacturing test data and statistical data analysis canbe used to reduce test time—Adaptive Test Time Reduction (ATTR), toimprove yield or to prevent damage to devices or their reliability.Modification of test process or content can be performed in real-timewithout changing test programs. One of the main challenges of real-timedynamical modification of test process or content, is uncertaintywhether subsequent tests will remain stable after a group of tests isremoved from the execution sequence.

In addition to a logical dependence between tests, a given group oftests (i.e. one or more tests) may inter alia serve as a time buffer forsettling of residual noise left from preceding test or tests, thusenabling tests following after such a group to be executed properly. Theresidual noise results from a well-known phenomenon that devices cannotrespond instantaneously and will exhibit transient responses when theyare subjected to inputs or disturbances. During testing, both devicesunder test (DUT) (referred to more generally as tested objects) anddevices within components of a testing system, can be sources of saidresidual noise. Depending on type of the DUT and the testing system, theresidual noise can be electrical, mechanical, thermal, electromagnetic,etc. The noise can be analog or digital. Settling time may be referredto as the time elapsed from the application of an ideal instantaneousstep input to the time at which the device output has entered andremained within a specified error band. It may be difficult to identifyor characterize the dependency on the given group of tests to serve as abuffer for settling at the time of real-time AT and therefore there maybe uncertainty about how subsequent remaining tests will perform if agroup of tests is removed from the execution sequence.

Because of this uncertainty, real-time AT is often replaced by testprogram re-structuring followed by a lengthy test program qualification.

References considered to be relevant as background to the presentlydisclosed subject matter are listed below:

http://www.semi.org/en/sites/semi.org/files/docs/ITRS_AdaptiveTest_WhitePaper2013.pdf

https://en.wikipedia.org/wiki/Settling_time.

https://www.lens.org/lens/search?q=settling+time+%26%26+test+time+reduction&1=en

https://www.lens.org/lens/patent/U.S. Pat. No. 7,646,204 B2 “Method AndSystem For Testing A Settling Time For A Device-under-test”

https://www.lens.org/lens/patent/US_5726996_A “Process For DynamicComposition And Test Cycles Reduction”

https://www.lens.org/lens/search?q=settling+time+%26%26+test+reordering&1=en

https://www.lens.org/lens/patent/US_2013_0006567_A1 “Method AndApparatus For Scheduling A Use Of Test Resources Of A Test ArrangementFor The Execution Of Test Groups”

Acknowledgement of the above references herein is not to be inferred asmeaning that these are in any way relevant to the patentability of thepresently disclosed subject matter.

There is thus a need in the art for a new technique for dynamicallymodifying an execution sequence of tests in real time.

SUMMARY OF THE INVENTION

The present invention is in the field of Dynamic process for AdaptiveTesting (AT).

Thus, in accordance with an aspect of the invention, there is provided amethod for modifying the execution sequence of tests for testing anobject on a test system; the tests include a group of tests that is acandidate for replacement, the method comprising, while executing thetests according to the execution sequence and before executing the groupof tests, modifying, in real time, the execution sequence including:executing a delay instead of the group of tests, wherein the delay isrelated to the group of tests.

Thus, in accordance with an embodiment of the invention, there isfurther provided a method, wherein the modifying of execution of thesequence includes: receiving in the test system an indication to executethe delay related to the group of tests and to not execute the group oftests.

Thus, in accordance with an embodiment of the invention, there is yetfurther provided a method, wherein a test flow is augmented by acomputer system before the execution of the tests by inserting the delayrelated to the group of tests, for selectively executing either thedelay or the group of tests, and wherein, modifying the executionsequence includes: at least one of (i) receiving in the test system anindication to not execute the group of tests, and (ii) receiving in thetest system an indication to execute the delay.

Thus, in accordance with an embodiment of the invention, there is yetfurther provided a method, wherein remaining tests in the executionsequence are not logically dependent on the group of tests.

Thus, in accordance with an embodiment of the invention, there is yetfurther provided a method, wherein the group of tests serves at least asa time buffer for settling time after previous tests in the executionsequence.

Thus, in accordance with an embodiment of the invention, there is yetfurther provided a method, wherein the tests include at least one othergroup of tests that is a candidate for replacement, and whereinmodifying the execution sequence includes executing at least one otherdelay instead of the at least one other group of tests, wherein the atleast one other delay is related to the at least one other group oftests.

Thus, in accordance with an embodiment of the invention, there is yetfurther provided a method wherein the object is a semiconductor chip.

Thus, in accordance with an embodiment of the invention, there is yetfurther provided a method, wherein execution of the delay reduces therisk of instability arising from the removal of the group of tests.

Thus, in accordance with an aspect of the invention, there is yetfurther provided a method for providing an indication to a test systemto modify an execution sequence of tests for testing an object on thetest system; the tests include a group of tests that is a candidate forreplacement: comprising, by a computer system associated with the testsystem: while the tests are being executed by the test system accordingto the execution sequence, if it is determined that the group of testsis not to be executed, obtaining a delay related to the group of tests,and before the group of tests is executed, providing the indication tothe test system to modify in real time the execution sequence of thetests for executing the delay instead of the group of tests.

Thus, in accordance with an embodiment of the invention, there is yetfurther provided a method, wherein the at least one of the delay and thegroup of tests is determined by the computer system based on one or morerules.

Thus, in accordance with an embodiment of the invention, there is yetfurther provided a method, wherein the delay is shorter than anexecution duration of the group of tests related thereto.

Thus, in accordance with an embodiment of the invention, there is yetfurther provided a method, wherein the delay is set to a default value.

Thus, in accordance with an embodiment of the invention, there is yetfurther provided a method, wherein the delay is set at least partlybased on an input received by the computer system.

Thus, in accordance with an embodiment of the invention, there is yetfurther provided a method, wherein the delay is set at least partlybased on estimated settling time.

Thus, in accordance with an embodiment of the invention, there is yetfurther provided a method, wherein the delay is set at least partlybased on the execution duration of the group of tests.

Thus, in accordance with an embodiment of the invention, there is yetfurther provided a method, wherein the delay is set at least partlybased on properties of tests that precede the group of tests.

Thus, in accordance with an embodiment of the invention, there is yetfurther provided a method, wherein the delay is set at least partlybased on historical performance of tests that follow after the group oftests.

Thus, in accordance with an embodiment of the invention, there is yetfurther provided a method, wherein the delay is set at least partlybased on calibration data for the test system.

Thus, in accordance with an embodiment of the invention, there is yetfurther provided a method, wherein the delay is set at least partlybased on simulation data.

Thus, in accordance with an embodiment of the invention, there is yetfurther provided a method, further comprising: in response to theprovision of indication, the test system executing the delay instead ofthe group of tests.

Thus, in accordance with an embodiment of the invention, there is yetfurther provided a method, wherein the tests include at least one othergroup of tests that is a candidate for replacement, and wherein theindication to modify the execution sequence is provided for executing atleast one other delay instead of the at least one other group of tests,wherein the at least one other delay is related to the at least oneother group of tests.

Thus, in accordance with an aspect of the invention, there is yetfurther provided a method for providing an indication to a test systemto modify an execution sequence of tests for testing an object on thetest system, the tests including a group of tests that is a candidatefor replacement: comprising, by a computer system associated with thetest system:

-   -   (i) obtaining the group of tests;    -   (ii) receiving from the test system a first indication that a        test flow is loaded;    -   (iii) augmenting the test flow by inserting the delay related to        the group of tests for selectively executing either the delay or        the group of tests and providing the augmented test flow to the        test system;    -   (iv) while the tests are being executed by the test system        according to the execution sequence,        -   if it is determined that the group of tests is not to be            executed, obtaining a delay related to the group of tests,        -   and before the group of tests is executed, providing the            indication to said test system to modify in real time the            execution sequence of the tests for executing the delay            instead of the group of tests.

Thus, in accordance with an embodiment of the invention, there is yetfurther provided a method, further comprising: in response to saidprovision of indication, the test system executing the delay instead ofthe group of tests.

Thus, in accordance with an embodiment of the invention, there is yetfurther provided a method, wherein the tests include at least one othergroup of tests that is a candidate for replacement, and wherein theaugmentation of the test flow further includes inserting at least oneother delay related to the at least one other group of tests for, withrespect to any other delay and related other group of tests, selectivelyexecuting either the other delay or the other group of tests.

Thus, in accordance with an embodiment of the invention, there is yetfurther provided a method, wherein the indication to modify theexecution sequence is provided for executing the at least one otherdelay instead of the at least one other group of tests.

Thus, in accordance with an aspect of the invention, there is yetfurther provided a computer system for providing an indication to a testsystem associated therewith to modify an execution sequence of tests fortesting an object on the test system; the tests include a group of teststhat is a candidate for replacement, the computer system beingconfigured to perform, including: while the tests are being executed bythe test system according to the execution sequence, if it is determinedthat the group of tests is not to be executed, obtaining a delay relatedto the group of tests, and before the group of tests is executed,providing the indication to the test system to modify in real time theexecution sequence of the tests for executing the delay instead of thegroup of tests.

Thus, in accordance with an embodiment of the invention, there is yetfurther provided a computer system, further comprising: in response tothe provision of indication, the test system being configured to executethe delay instead of the group of tests.

Thus, in accordance with an embodiment of the invention, there is yetfurther provided a computer system, wherein the tests include at leastone other group of tests that is a candidate for replacement, andwherein the indication to modify the execution sequence is provided forexecuting at least one other delay instead of the at least one othergroup of tests, wherein the at least one other delay is related to theat least one other group of tests.

Thus, in accordance with an embodiment of the invention, there is yetfurther provided a computer system, wherein the test system isassociated with the computer system by utilizing an ApplicationProgramming Interface (API).

Thus, in accordance with an embodiment of the invention, there is yetfurther provided a computer system, being configured to provide anindication to the test system through the API.

Thus, in accordance with an embodiment of the invention, there is yetfurther provided a computer system, wherein the computer system includesa first computer system and a proxy computer system and wherein the testsystem is associated with the computer system by utilizing the Proxycomputer system.

Thus, in accordance with an embodiment of the invention, there is yetfurther provided a computer system wherein the first computer systembeing configured to provide the indication to the test system throughthe proxy computer system.

Thus, in accordance with an aspect of the invention, there is yetfurther provided a computer system for providing an indication to a testsystem associated therewith to modify an execution sequence of tests fortesting an object on the test system; the tests include a group of teststhat is a candidate for replacement, the computer system beingconfigured to perform, including:

-   -   (i) obtaining the group of tests;    -   (ii) receiving from the test system a first indication that a        test flow is loaded;    -   (iii) augmenting the test flow by inserting the delay related to        the group of tests for selectively executing either the delay or        the group of tests and providing the augmented test flow to the        test system;    -   (iv) while the tests are being executed by the test system        according to the execution sequence,        -   if it is determined that the group of tests is not to be            executed, obtaining a delay related to the group of tests,        -   and before the group of tests is executed, providing the            indication to the test system to modify in real time the            execution sequence of the tests for executing the delay            instead of the group of tests.

Thus, in accordance with an embodiment of the invention, there is yetfurther provided a computer system, further comprising in response tothe provision of indication, the test system being configured to executethe delay instead of the group of tests.

Thus, in accordance with an embodiment of the invention, there is yetfurther provided a computer system, wherein the tests include at leastone other group of tests that are candidates for replacement, andwherein the augmentation of the test flow further includes inserting atleast one other delay related to the at least one other group of testsfor, with respect to any other delay and related other group of tests,selectively executing either the other delay or the other group oftests.

Thus, in accordance with an embodiment of the invention, there is yetfurther provided a method wherein the indication to modify the executionsequence is provided for executing the at least one other delay insteadof the at least one other group of tests.

Thus, in accordance with an embodiment of the invention, there is yetfurther provided a computer system wherein the test system is associatedwith the computer system by utilizing an Application ProgrammingInterface (API).

Thus, in accordance with an embodiment of the invention, there is yetfurther provided a computer system being configured to receive the firstindication from the test system and to provide the indication to thetest system through the API.

Thus, in accordance with an embodiment of the invention, there is yetfurther provided a computer system wherein the computer system includesa first computer system and a proxy computer system and wherein the testsystem is associated with the computer system by utilizing the Proxycomputer system.

Thus, in accordance with an embodiment of the invention, there is yetfurther provided a computer system wherein the first computer systembeing configured to receive the first indication from the test systemthrough the proxy computer system, and wherein the first computer systembeing configured to provide the indication to the test system throughthe proxy computer system.

Thus, in accordance with an embodiment of the invention, there is yetfurther provided a computer system being configured to augment the testflow of the tests including specifying the delay as a slot.

Thus, in accordance with an aspect of the invention, there is yetfurther provided a computer program product comprising a non-transitorycomputer useable medium having computer readable program code embodiedtherein for providing an indication to a test system to modify anexecution sequence of tests for testing an object on the test system;the tests include a group of tests that is a candidate for replacementthe computer program product comprising:

-   -   computer readable program code for causing the computer system,        while the tests are being executed by the test system according        to the execution sequence,        -   if it is determined that the group of tests is not to be            executed, obtaining a delay related to the group of tests,            and before the group of tests is executed, providing the            indication to the test system to modify in real time the            execution sequence of the tests for executing the delay            instead of the group of tests.

Thus, in accordance with an aspect of the invention, there is yetfurther provided a computer program product comprising a non-transitorycomputer useable medium having computer readable program code embodiedtherein for providing an indication to a test system to modify anexecution sequence of tests for testing an object on the test system;the tests include a group of tests that is a candidate for replacementthe computer program product comprising:

-   -   computer readable program code for causing a computer system to        obtain the group of tests;        -   computer readable program code for causing a computer system            to receive from the test system a first indication that a            test flow is loaded;        -   computer readable program code for causing a computer system            to augment the test flow by inserting the delay related to            the group of tests for selectively executing either the            delay or the group of tests and providing the augmented test            flow to the test system;            -   computer readable program code for causing the computer                system, while the tests are being executed by the test                system according to the execution sequence,            -   if it is determined that the group of tests is not to be                executed, obtaining a delay related to the group of                tests,            -   and before the group of tests is executed, providing the                indication to the test system to modify in real time the                execution sequence of the tests for executing the delay                instead of the group of tests.

BRIEF DESCRIPTION OF THE DRAWINGS

In order to better understand the subject matter that is disclosedherein and to exemplify how it may be carried out in practice,embodiments will now be described, by way of non-limiting example only,with reference to the accompanying drawings, in which:

FIG. 1 illustrates a generalized test system in accordance with theprior art;

FIGS. 2A-B illustrate, schematically, an exemplary process of combininga logically dependent group of tests for obtaining a test flow thatincludes a combined group of tests that are candidates for removal;

FIG. 3A-B illustrate, schematically, a test flow that includes tests,corresponding execution sequence of the tests and a modified executionsequence, in accordance with certain embodiments of the invention;

FIG. 4A-C illustrate, schematically, a test flow, an augmented test flowand corresponding execution sequences, in accordance with certainembodiments of the invention;

FIG. 5A-C illustrate, schematically, a test flow, an augmented test flowand corresponding execution sequences, in accordance with certainembodiments of the invention;

FIG. 6 illustrates a generalized system architecture of a test systemand associated computer system, in accordance with certain embodimentsof the invention;

FIG. 7 illustrates a flowchart of a sequence of operations performed ina computer system according to the prior art;

FIG. 8A illustrates a flowchart of a sequence of operations performed ina computer system, according to certain embodiments of the invention;and

FIG. 8B illustrates a flowchart of a sequence of operations performed ina computer system, according to certain other embodiments of theinvention.

DETAILED DESCRIPTION OF EMBODIMENTS

The present invention is in the field of Dynamic Processes for AdaptiveTests (AT).

Note that in the description below, whenever reference is made toaction(s) performed by a test system (e.g. 100 in FIG. 1), this mayembrace an action performed by a computer program such as, but notlimited to, a test system's Operating System (OS) running on aprocessor(s) forming part of the test system.

For simplicity, the various embodiments are described below withreference to semiconductor Device Under Test (DUT). Note that theinvention is not bound to DUT which is only one example of an object andaccordingly the invention may be applied to testing objects other than asemiconductor DUT.

Turning now to FIG. 2A-B, it illustrates, schematically, an exemplaryprocess of combining logically dependent groups of tests {S2 and S3} forobtaining a test flow that includes a combined group of tests {G2} thatcan be removed without logically affecting remaining tests. Turning atfirst to FIG. 2A, group of tests {S1, S2, S3, S4} 350 are designated tobe candidates for removal during AT and they may potentially be removedfrom the execution sequence. These candidate groups may be identified inadvance in preparation for the AT setup (e.g. by a server of a computersystem—see discussion with reference to FIG. 6 below). Any number(none/a few/all) of tests (or test groups) may be candidates for removalfrom among the group of tests 350.

During AT set up process, a user, e.g. a product engineer, may revieweach group of tests in order to identify logical relationships betweenthe group and the rest of tests. Thus, for example, logically dependenttests {S3} may be combined with the tests {S2}, on which they depend, toform a single logical group of tests {G2} (see FIG. 2A) that is acandidate for removal. The resulting group G2 contains logicallydependent tests while the rest of the tests (by this example tests ingroups G1 and G3) of the group of tests (300) are not logicallydependent on any of the tests within the group G2. The latter may beconsidered a group of tests that is a candidate for removal 360 and maypotentially be removed during real-time AT without logically affectingremaining tests. For as long as no other tests depends on G1 or G3, thegroups G1 and G3 may also be considered groups of tests that arecandidates for removal 360 and may potentially be removed duringreal-time AT without logically affecting remaining tests.

Note that the step of reviewing the group of tests for logicaldependencies may be obviated, in which case the group(s) of tests thatis (are) candidates for removal is automatically considered a candidatefor removal group.

In addition to logical dependence, the candidate group of tests mayinter alia serve as a buffer for settling time for residual noise leftfrom a preceding test or tests of the specified candidate group, thusenabling tests following after such a candidate group to be executedproperly. Removing such a group of tests that is a candidate for removalfrom the execution sequence may result in instability of subsequentremaining tests, even if the remaining tests are not logically dependenton the removed group.

Performance instability of a remaining test may lead to a greaterfallout from the test or any other unexpected or inconsistent testresults, faulty measurements or measurement logs, invalid yield loss ormisclassification, higher number of test aborts or hang ups, damage tothe DUT or to the testing system, and/or other undesired outcomes.

Attention is now drawn to FIG. 3A-B, illustrating, schematically, a testflow of tests (3A), corresponding execution sequence of the tests and amodified execution sequence of the tests (3B), in accordance withcertain embodiments of the invention.

Reference will also be made to FIG. 6 illustrating a generalized systemarchitecture of a test system and associated computer system, inaccordance with certain embodiments of the invention, and to FIG. 8Aillustrating a flowchart of a sequence of operations performed in acomputer system, according to certain embodiments of the invention.

Consider, for example, a test flow 300 of 3 consecutive groups of tests{G1, G2, G3} that are candidates for removal.

From among the groups of tests that are candidates for removal, adecision may be made which group or groups would be replaced with adelay, if such group is removed. Such group or groups are referred to ascandidates for replacement groups. This decision can be made during ATset up or e.g. during AT based on input such as client input or a rule.Not all candidates for removal groups are candidates for replacementgroups.

Note that for each group of tests that is a candidate for replacement, adelay is set to be used instead. The delay will only be used, if, duringexecution, it is decided to remove that group. If, during execution, itis decided not to remove that group, then the group stays and the delayis not executed.

While throughout the description the term candidate group forreplacement is used, it should be noted that such a candidate group maybe removed from the execution sequence or alternatively executed,depending upon a decision made during execution of the tests, all aswill be explained in greater detail below.

By this example, G2 360 is a candidate for replacement. Removal of G2from the execution sequence 400 may lead to greater fallout of group G3although the two (G2 and G3) are logically independent. This may beexplained, for example, by residual noise left after the execution of G1that is now still in effect during the execution of G3. Before G2 wasremoved, it inter alia may have served as a buffer for settling time forresidual noise left after execution of G1. It may be difficult toidentify or characterize this dependency of G3 on G2 to serve as abuffer for settling time at the time of AT, in real-time, and thereforethere may be uncertainty about how G3 will perform if G2 is removed fromthe execution sequence. Because of this uncertainty, it is oftendecided, in accordance with the prior art, not to remove G2 inreal-time, thus forgoing the potential AT benefits.

In accordance with certain embodiments of the invention (shown in FIG.3B), during real-time AT namely while executing the tests for testingthe object in the test system 100 (i.e. upon executing T11 or later butbefore executing T21 that forms part of the candidate group G2), a delay451 is executed in the test system 100 instead of the G2 candidate groupfor replacement (that is removed from the execution sequence) givingrise to a modified execution sequence of tests 400′. The indication toexecute the delay instead of the candidate group for replacement may bereceived from computer system 450 (see FIG. 6).

The delay is executed by the test system 100 (see FIG. 6) if G2 isremoved from the execution sequence 400, in other words, in place of G2,and it may serve as a buffer for settling time for residual noise leftfrom G1 prior to execution of G3. The delay relates to G2 in a sensethat its execution is conditional on non-execution of G2. This solutionmay reduce the risk of instability of G3, while providing test timereduction benefits as long as the delay is shorter than duration of G2,or having no impact on test time as long as the delay does not exceedthe duration of G2. Assume, for example, that G2 duration is 150 ms andthat the delay is 10 ms, therefore replacing G2 with such a delay wouldrealize test time reduction of 140 ms, while allowing 10 ms forsettling.

Constructing a modified sequence of operations by replacing a group oftests that is a candidate for replacement with a delay can be performedfor as many candidate test groups as needed, thus enabling real-time ATfor test flows with multiple test groups. The computer system 600 mayprovide an indication (embracing one or more indications) for executinga delay instead of a corresponding group of tests, indicating that thegroup is a candidate for replacement.

Note that the modified execution sequence 400′ does not necessarilyrequire constructing the entire sequence in advance before replacing thecandidate group by the corresponding delay. Thus, for example, withreference to FIG. 3B, while executing G1 and before adding G3 tosequence 400′, G2 is replaced by a delay. G3 can be added to thesequence at any time as long as it is included in the execution sequencebefore the delay 451 has elapsed.

In some cases, removal of G2 from the execution sequence may not lead togreater fallout of group G3 indicating that G2 did not serve as a bufferfor settling time for residual noise left after execution of G1. Incertain embodiments, it may be more efficient in terms of test time andsystem resources to determine (e.g. during AT set up process by a user,say a product engineer) whether a candidate for removal group does interalia serve as a time buffer allowing for settling, in advance. So onlysuch candidate for removal groups are considered candidates forreplacement and can potentially be replaced with a delay if removedduring real-time AT.

In accordance with certain embodiments, the step of determining whetherthe candidate for removal group serves as a buffer for settling may beobviated, in which case the candidate for removal group is automaticallyconsidered a candidate for replacement group.

Depending on test system configuration, the execution of the delay cancause the test system 100 to e.g. stay idle or sleep, or it may allowthe test system to perform background activities for the duration of thedelay. The test system does not execute G3 until the specified delay isexecuted.

Depending on test system 100 configuration, the specification of thedelay, in particular its duration, can be determined during preparationfor real-time AT (e.g. by a computer system 600 associated with testsystem 100) or in real-time and provided to the test system (by computersystem 600) during AT.

In certain embodiments, the delay may be set, referred to herein in thecontext of setting a delay to include: a priori determined and providedto the computer system or determined by the computer system to apossible default value during preparation, with the expectation that anexplicit value could be provided in real-time. For example for ATTR, thedefault delay can be set 0 ms so in real-time it can be decided (bycomputer system 600) to activate the delay by providing an explicitvalue which is greater than 0. In accordance with certain embodiments,the delay can be set directly to its final value.

Longer delays may provide more cushion for the buffering for settlingwhile potentially negating the test time reduction benefits or havingmore negative effect on the test time. There are multiple considerationsthat can be taken into account independently or in conjunction with eachother for calculating the delay. All such considerations may beperformed in advance and a priori fed to the computer system (for laterdelivering to the test system) or determined by the computer systemitself based on one or more rules. Such consideration may include (butis not limited to): the goal of AT, the source and nature of theresidual noise, the configuration and calibration of the testing system,the properties of DUT and the properties and performance of relatedgroups of tests, and, in some cases, general knowledge. In some casesthere may not be enough specific data to calculate a precise value forthe delay and in such cases the delay can be estimated based at least inpart on general knowledge. For example, certain types of semiconductorDUTs are known to settle within 10-15 ms and therefore this range may beused for deciding the delay in the absence of better data. The data,based on which the delay is calculated, can come from an empiricalanalysis of the test system or of the test program, from historical dataon the same system or same test program, from historical data on arelated system or related test program, and from data obtained fromsimulation of testing.

Moving on with FIG. 3B, in accordance with certain embodiments, when agoal of removing G2 is ATTR, it may be advantageous to set the delay asshort as possible and to only implement a delay if it can be set shorterthan duration of the replaced group G2. The duration of G2 can sometimesbe obtained from a test system or estimated, based on knowledge aboutthe test program. A simulation based on G2 duration and a proposed delaycan be used to estimate ATTR benefits and to assist in determining thedelay. The invention is not bound by these examples.

In accordance with certain embodiments, when a goal of removing G2 isimproving yield or preventing damage to DUT or its reliability, thedelay may be set to the duration of the replaced group G2 to avoid theneed for settling a related analysis. In some cases, if it is known thatexisting duration of G2 was not sufficient to serve as a buffer forsettling time for residual noise from G1, it may be beneficial to setthe delay to be longer than duration of the replaced G2.

In accordance with certain embodiments, when residual noise can at leastin part be attributed to the devices within components of testingsystems, the configuration and calibration data of the test system maybe taken into account to provide a basis for calculating the delay toallow for settling of system related residual noise. Such data may comefrom the same test system as well as from other (e.g. similar) testsystems. These data can be derived from historical data, empiricalanalysis or be based on simulation. For example, the transmission linesthat connect the DUT and the test can introduce impedance based delaysand therefore test systems configuration with higher impedance willrequire longer settling times.

When residual noise can at least in part be attributed to the DUT, thedata about DUT configuration, packaging, format and behavior may betaken into account to provide a basis for calculating the delay to allowfor settling of DUT related residual noise. Such data may come from thesame group of DUTs and possibly from related DUTs. These data can bederived from e.g. historical data, empirical analysis or be based onsimulation. For example, packaged DUT may take a longer time to settlethan bare DUT due to additional load from the packaging hardware. Inanother example, historical data on similar DUT under similar testingconditions may show instability of G3 following a, say 10 ms delay whichmay indicate that a longer delay is needed. In another example, whenmultiple DUTs or units of a DUT are tested in parallel, and the G2 isremoved on one of the units, it may be necessary to delay G3 on thatunit until remaining units finish G2 or at least reach an appropriatestate at which G3 can run.

In accordance with certain embodiments, the purpose of the delay (ormultiple delays) may be to serve as a buffer for settling time forresidual noise from G1, therefore the properties of tests comprisinggroup G1 may be taken into account to provide a basis for calculatingthe delay. Such properties can include the nature of the tests and theireffect on the state of the DUT or on the state of the testing system.The relevant properties may be measured or derived empirically. Forexample, when G1 and G3 use the same power supply, the outgoing powerstate of the supply from G1 may become an input to G3 once G2 isremoved. Therefore the delay should be sufficient to allow for the powersupply to reach the state desired for G3. In another example, when G1and G3 use different temperature settings, the delay should besufficient to allow for the system to be freed from residual thermalnoise and the DUT to reach the temperature desired for G3. In anotherexample, when G1 and G3 use the same data bus for logging test data, thedelay should be sufficient for the logging of G1 results to be finishedand the bus to be freed from the residual digital noise before it can beused by G3. The invention is not bound by these examples.

In accordance with certain embodiments, the purpose of the delay (ordelays) may be to serve as a buffer for settling time so G3 can beexecuted properly, therefore the performance of tests comprising groupG3 may be taken into account to provide a basis for calculating thedelay. For example, historical data about G3 performance (with orwithout a delay in place) may indicate higher sensitivity to settlingand therefore necessitate longer delays. The historical data can beanalyzed in conjunction with simulation data for G3 to detectperformance instability.

Bearing all this in mind, attention is drawn to FIG. 8A, illustrating aflowchart of a sequence of operations performed in a computer system,for modifying the execution sequence of tests, according to certainembodiments of the invention. Thus, while executing the tests in thetest system 100 (which, by one non-limiting example may be made known tocomputer system 450 via an indication received from the test system—notshown in FIG. 8A), if it is determined (801) that a candidate group (orgroups) of tests that are candidates for replacement (see e.g.,discussion with reference to FIG. 3A) then in stage 802 a delay ordelays related to the candidate group(s) is (are) obtained. The delaymay be set, by either calculation in computer system 450 or received asinput thereto. Then, (803) the computer system 450 provides anindication (which may be one or more indications, as the case may be) tothe test system 100 to execute the delay instead of the groups that arecandidates for replacement. As may be recalled, an example of modifyingthe execution sequence was discussed with reference to FIG. 3B.

Note that the provision of indication to modify the execution sequencecan be at any stage from the commencement of the execution sequence(e.g. upon executing T11 or later) but before executing the candidategroup of tests (namely before executing the first test of that group).

Attention is now drawn to FIGS. 4A-C, illustrating, schematically, atest flow, an augmented test flow and corresponding execution sequences,in accordance with certain embodiments of the invention. Reference willalso be made to FIG. 6 illustrating a generalized system architecture ofa test system and associated computer system, in accordance with certainembodiments of the invention, and to FIG. 8B illustrating a flowchart ofa sequence of operations performed in a computer system, according tocertain other embodiments of the invention.

Thus, in accordance with certain embodiments, depending on test systemconfiguration and requirements, a test flow augmentation may be used toenable real-time modification of the execution sequence. In other cases,an existing API function or any other suitable programmatic mechanismcan be used to enable real-time modification of the execution sequence,e.g. as discussed with reference to FIGS. 3A-B above.

In accordance with certain embodiments of the invention, in preparationfor real-time AT, the test flow is augmented by inserting a delay to thegroup of tests for selectively executing either the delay or thecandidate group of tests. This enables either an execution sequence thatexcludes G2 but includes execution of the delay, in other words in placeof G2, or, alternatively, an execution sequence that includes G2 butexcludes execution of the delay. The addition of the delay may be donewithout restructuring the test program or modifying existing testcontent and therefore it does not require lengthy test programqualification. The delay relates to G2 in a sense that its execution isconditional on non-execution of G2.

The steps of augmenting the test flow can be repeated for as many testgroups as needed thus enabling real-time AT for test flows with multipletest groups.

Turning to FIG. 4A, in preparation for real-time AT, the group of testsis {G1, G2, G3} 300 FIG. 4A is augmented to incorporate an alternativetest group D2 370 (see FIG. 4B), execution of which would result inexecution of a delay 451 within the modified execution sequence 400′ (aswill be discussed with reference to FIG. 4C below). For clarity ofexplanation, the augmented test flow can be visualized as {G1, [G2, D2],G3} or {G1, [D2, G2], G3} where groups G2 and D2 are executedinterchangeably. The test flow augmentation may be realized in computersystem 450 and provided to the test system 100. Note that computersystem 450 may augment the test flow upon receipt of an indication thatthe test flow is loaded (encompassing while being loaded or after theload operation has been completed) by the test system 100.

Based on the so provided augmented test flow (see FIG. 4B), duringreal-time AT application, the computer system 450 may receive anindication from the test system 100 on the commencement of execution ofthe tests according to an execution sequence which may be constructed atleast partially based on the test flow. The commencement of executionmay refer to a stage upon execution of T11 or at a later stage, howeverbefore any of the tests embraced by G2 are executed (namely before groupof tests G2 is executed). Computer system 450 may then provide anindication based on the augmented test flow that G2 is to be removedfrom the execution sequence, followed by which D2 is executed instead,and the resulting modified execution sequence can be visualized as {G1,D2, G3} giving rise to the modified execution sequence depicted in FIG.4C. Note that in accordance with certain embodiments, the computersystem 450 may conclude the execution of the tests not necessarily byreceiving an indication from the test system, but rather based on otherconsiderations, e.g. based on data from previous tests or tests outputthat it received (from the test system), all as known per se.

Alternatively, computer system 450 may then provide to test system 100an indication that G2 is not to be removed from the execution sequence;then D2 is not executed and the resulting (original) execution sequencecan be visualized as {G1, G2, G3}.

Note that in accordance with this embodiment, test flow augmentationdoes not modify the content of G1, G2 or G3. For instance, the testgroup D2 may contain a single test with a single instruction to the testsystem to sleep for 15 ms, but there could be other ways to specify thedelay depending on test system configuration. For example, the durationof the delay can be specified in units of time or in clock cycles.Similarly, depending on test system configuration, there also could beother ways to augment the test flow to incorporate an alternative testgroup. It is advantageous to create an inverse relationship between G2and D2 within the flow, such that the execution of D2 is conditional onnon-execution of G2.

Bearing this in mind and turning to FIG. 8B, the candidate group(s) oftest (for replacement) and the related delay(s) are obtained, shown as811 and 812. A test flow augmentation is performed 813 by inserting adelay (see e.g. FIG. 4B) allowing selective execution of either thecandidate group or the delay (e.g. step 814). Note, the logicalconnection between the group and the delay is optional since not alltest systems can process a test flow with such connection. Systems thatcan process the connection may be provided with an indication to“execute D2”, and the G2 does not get executed automatically based onthe logical connection, while others have to be provided with anindication “skip D2, execute G2” since there is no logical connectionbetween G2 and D2.

Note that providing an indicating to the test system discussed hereinmay include any known per se manner.

Reverting to FIG. 8B, for those candidates to be replaced 815, thecomputer system provides to test system 100 (upon commencing theexecution sequence of tests as discussed above) an indication to modifythe execution sequence by executing the delay instead of the candidategroup for replacement 816. In case that logical link has beenestablished (814), an indication not to execute the candidate group orexecute the delay may suffice. Alternatively, if no such logical link isestablished, an indication not to execute the candidate group andexecute the delay may be required. The invention is not bound by theseexamples.

Alternatively, in cases where the candidate group should be retained817, the computer system provides an indication to the test system toexecute the candidate group, rather than the delay. Considering thatsuch an option may be a priori included in the augmented test flow (e.g.by using proper indication in a place holder—see discussion below), thelatter step may be obviated.

With reference to FIG. 6, in accordance with certain embodiments of theinvention, the computer system architecture 450 may include a Serversystem (Controller/Algorithmic Engine) 500, a Proxy computer system 600and optionally a Client (Portal) 700. It is understood that all or someof the specified systems can reside within the test system 100 or beexternal to it. It is also understood that each system can be separatefrom others, combined with another system, or be embedded into anothersystem. Each of the various systems as a whole can inter alia performtasks which are beyond the scope of the present invention. Any of theabove are examples embraced by the term computer system. The same holdstrue for a test system mutatis mutandis.

The Server 500 is a computer system that, among other tasks, based onvarious parameters such as manufacturing test data and statistical dataanalysis, can perform AT tasks such as identifying one or more groups oftests that are candidates for removal. The Server 500 may also performtasks such as determining the logical dependencies between the group oftests that is a candidate for removal and the rest of the tests, asdiscussed in detail with reference to FIGS. 2A-B above, and determiningthe candidate group(s) for replacement from among the candidate groupsfor removal. The server 500 may, in accordance with certain embodiments,perform the task of augmenting the test flow as described, e.g. withreference to FIG. 4A-B. Any of the specified tasks (or others may bewholly processes or calculated in Server computer system 500 oralternatively partially (or wholly) based on input(s) received at server500 from an external source.

In accordance with certain embodiments, the receipt and/or provision ofthe various indication(s) discussed above may be implemented by means ofa Proxy computer system. The Proxy, based on information received fromthe Server, or inputs from the Client if present, may provideindications (e.g. instructions) to the test system 100 (e.g. tester OS),receive indications (e.g. responses and/or data from the test system(e.g. OS) and, whenever necessary, pass them to the Server or to theClient, if present.

If present, the Client 700 may be in communication with the Proxycomputer system 600 and, in some cases, with the Server 500. The Clientmay receive inputs (such as Delay duration, identification for a groupto be replaced, etc.) from the user and pass related information to theProxy or Server. The Client can also receive responses and data from theProxy or Server and display related information to the user.

In accordance with certain embodiments, during real-time AT, the Serverdetermines if a candidate for replacement group needs to be removed fromthe execution sequence. If the decision is to remove, then based oncorresponding input from the Server, the Proxy signals non-execution ofsaid group and execution of the delay to the test OS using an existingAPI function or any other suitable programmatic mechanism.

In accordance with certain other embodiments, instead of the Proxy 600,a known per se Application Programming Interface (API) may be utilizedby computer system 450. Thus, for example, the test OS of test system100 may instead query the Server for an indication if a candidate groupneeds to be removed from the execution sequence using an existing APIfunction or any other suitable programmatic mechanism.

Note that the utilization of Proxy or API are only examples ofassociation between the computer system 450 and the test system 100.

Bearing this in mind, and depending on test system configuration andrequirements, a test flow augmentation may be used to enable real-timemodification of the execution sequence.

Thus, in accordance with certain embodiments, when test flowaugmentation is used, in preparation for real-time AT, after loading thetest program but before validating it, the Proxy in conjunction with thetest OS augment the test flow by injecting a place holder, or slot, forthe time delay for a candidate for replacement group of tests. This isillustrated schematically in FIG. 5B by designating slot 361. Thevarious other elements depicted in FIGS. 5A-C are similar to those ofcorresponding FIGS. 4A-C which were described in detail above.

Bearing this in mind, the candidate for replacement group is identifiedamong all groups by the Server and is communicated to the Proxy. Theslot is injected as a new entry into the test flow without modifyingexisting tests within the flow. A slot contains a place holder for theactual length of delay. The place holder may hold a default value forthe delay to be used if no other value is provided. A slot is logicallylinked to non-execution of the related candidate for replacement groupof tests so they will be executed interchangeably. This logical linkcan, for instance, be realized by utilizing an inverted value, alsoknown as logical pair, of a logical parameter that signals execution ofthe related group. An example of such a pair can be (true/false), (1/0),(−1/1) etc. and its syntax depends on test system requirement.

In accordance with certain embodiments, during real-time AT, the Serverdetermines if the candidate for replacement group needs to be removedfrom the execution sequence. If the decision is to remove, then based oncorresponding input from the Server, the Proxy uses the said logicalparameter to signal non-execution of said group to the test OS. Theinversion of this parameter in turn signals the test OS to execute therelated delay. Alternatively, if the decision is not to remove, thenbased on corresponding input from the Server, the Proxy uses the saidlogical parameter to signal execution of the said group to the test OS.The inversion of this parameter in turn signals the test OS not toexecute the related delay. In some testing systems, said signaling ofexecution of said group is not required and no related communicationfrom the Server or the Proxy is necessary.

The Server may at least partly rely on a set of rules for determiningwhether a given test flow is to be augmented. For example, such a rulemay list a set of requirements such as appropriate group of material,location, test system identification, etc. which must be met for theaugmentation to take place.

Similarly, the Server may at least partly rely on a set of rules fordetermining the delay to be executed in place of removed G2. Forexample, such a rule may list groups of material and correspondingdelays.

Note that the invention is not bound by the utilization of a slot/placeholder during the augmentation phase for facilitating the modificationof the execution sequence.

It should be noted, generally, that in accordance with certainembodiments of the invention, executing of the delay or delays) reducesthe risk of instability arising from the removal of the candidategroup(s) of tests.

In the following detailed description, numerous specific details are setforth in order to provide a thorough understanding of the invention.However, it will be understood by those skilled in the art that thepresent invention may be practiced without these specific details. Inother instances, well-known features, structures, characteristics,stages, methods, procedures, modules, components and systems, have notbeen described in detail so as not to obscure the present invention.

Unless specifically stated otherwise, as apparent from the followingdiscussions, it is appreciated that throughout the specificationdiscussions utilizing terms such as “processing”, “executing”,“calculating”, “computing”, “determining”, “obtaining”, “setting”,“providing” “augmenting” or the like, include action and/or processes ofa computer that manipulate and/or transform data into other data, saiddata represented as physical quantities, e.g. such as electronicquantities, and/or said data representing the physical objects.

The term computer should be expansively construed to cover any kind ofelectronic with data processing capabilities and which is made up of anycombination of hardware, software and/or firmware and which includes atleast some hardware, even if not labeled as such in the disclosure. Nonlimiting examples of a computer include computer system test system or apart thereof. The latter may include one or more computers co-located orspaced apart.

The operations in accordance with the teachings herein may be performedby a computer specially constructed for the desired purposes or by ageneral purpose computer specially configured for the desired purpose bya computer program stored in a non-transitory computer readable storagemedium. The term “non-transitory” is used herein to exclude transitory,propagating signals, but to otherwise include any volatile ornon-volatile computer memory technology suitable to the application.

Reference in the specification to “certain embodiments”, “e.g.”,“example” “a case”, “some cases”, “another case”, or variants thereofmeans that a particular feature, structure, characteristic, stagemethod, module described in connection with the embodiment(s) isincluded in at least one non-limiting embodiment of the presentlydisclosed subject matter. Thus the appearance of any of these phrases orvariants thereof does not necessarily refer to the same embodiment(s)and may be combined with other embodiments.

Embodiments of the presently disclosed subject matter are not describedwith reference to any particular programming language. It will beappreciated that a variety of programming languages may be used toimplement the teachings of the presently disclosed subject matter asdescribed herein.

It is appreciated that, unless specifically stated otherwise, certainfeatures of the presently disclosed subject matter, which are, forclarity, described in the context of separate embodiments, may also beprovided in combination in a single embodiment. Conversely, variousfeatures of the presently disclosed subject matter, which are, forbrevity, described in the context of a single embodiment, may also beprovided separately or in any suitable sub-combination.

In embodiments of the presently disclosed subject matter, fewer, moreand/or different stages than those shown in FIGS. 8A and 8B may beexecuted. In embodiments of the presently disclosed subject matter oneor more stages illustrated in FIGS. 8A, 8B-B may be executed in adifferent order and/or one or more groups of stages may be executedsimultaneously. FIG. 6 illustrates a general schematic of the systemarchitecture in accordance with an embodiment of the presently disclosedsubject matter. Each module in FIG. 6. may include any combination ofsoftware, hardware and/or firmware that performs the functions asdefined and explained herein. The modules in FIG. 6 may be centralizedin one location or dispersed over more than one location. In otherembodiments of the presently disclosed subject matter, the system maycomprise fewer, more, and/or different modules than those shown in FIG.6.

Alternatively to the example shown in FIG. 6, system 450 may in someexamples include fewer, more and/or different modules than shown in FIG.6. Alternatively to the example shown in FIG. 6, the functionality ofsystem 450 may in some examples be divided differently among the modulesillustrated in FIG. 6. Alternatively to the example shown in FIG. 6, thefunctionality of system 450 described herein may in some examples bedivided into fewer, more and/or different modules than shown in FIG. 6and/or system 450 may in some examples include additional, less, and/ordifferent functionality than described herein.

The computer system of FIG. 6 comprises or is otherwise associated withone or more processors configured to execute operations as disclosedherein. The term processor as used herein should be expansivelyconstrued to cover any kind of electronic device with data processingcapabilities, including, by way of non-limiting example, by way ofnon-limiting example, a personal computer, a server, a computing system,a communication device, a processor (e.g. digital signal processor(DSP), a microcontroller, a field programmable gate array (FPGA), anapplication specific integrated circuit (ASIC), etc.), any otherelectronic computing device, and or any combination thereof.

It is to be understood that the presently disclosed subject matter isnot limited in its application to the details set forth in thedescription contained herein or illustrated in the drawings. Thepresently disclosed subject matter is capable of other embodiments andof being practiced and carried out in various ways. Hence, it is to beunderstood that the phraseology and terminology employed herein are forthe purpose of description and should not be regarded as limiting. Assuch, those skilled in the art will appreciate that the conception uponwhich this disclosure is based may readily be utilized as a basis fordesigning other structures, methods, and systems for carrying out theseveral purposes of the present presently disclosed subject matter.

It will also be understood that the system according to the presentlydisclosed subject matter can be implemented, at least partly, as asuitably programmed computer. Likewise, the presently disclosed subjectmatter contemplates a computer program being readable by a computer forexecuting the disclosed method. The presently disclosed subject matterfurther contemplates a machine-readable memory tangibly embodying aprogram of instructions executable by the machine for executing thedisclosed method.

While certain features of the invention have been illustrated anddescribed herein, many modifications, substitutions, changes, andequivalents will now occur to those of ordinary skill in the art. It is,therefore, to be understood that the appended claims are intended tocover all such modifications and changes as fall within the true spiritof the invention.

It will be appreciated that the embodiments described above are cited byway of example, and various features thereof and combinations of thesefeatures can be varied and modified.

While various embodiments have been shown and described, it will beunderstood that there is no intent to limit the invention by suchdisclosure, but rather, it is intended to cover all modifications andalternate constructions falling within the scope of the invention, asdefined in the appended claims.

1. A method for modifying an execution sequence of tests for testing anobject on a test system; the tests include a group of tests that is acandidate for replacement, the method comprising: while executing thetests according to the execution sequence and before executing the groupof tests, modifying, in real time, the execution sequence including:executing a delay instead of the group of tests, wherein the delay isrelated to the group of tests.
 2. The method according to claim 1,wherein said modifying the execution sequence includes: receiving in thetest system an indication to execute the delay related to the group oftests and to not execute the group of tests.
 3. The method according toclaim 1, wherein a test flow is augmented by a computer system beforethe execution of the tests by inserting the delay related to the groupof tests, for selectively executing either the delay or the group oftests, and wherein, modifying the execution sequence includes: at leastone of (i) receiving in the test system an indication to not execute thegroup of tests, and (ii) receiving in the test system an indication toexecute the delay.
 4. The method according to claim 1, wherein remainingtests in the execution sequence are not logically dependent on the groupof tests.
 5. The method according to any one of the preceding claim 1,wherein the group of tests serves at least as a time buffer for settlingtime after previous tests in the execution sequence.
 6. The methodaccording to claim 1, wherein the tests include at least one other groupof tests that is a candidate for replacement, and wherein said modifyingthe execution sequence includes executing at least one other delayinstead of the at least one other group of tests, wherein the at leastone other delay is related to the at least one other group of tests. 7.The method according to claim 1, wherein the object is a semiconductorchip.
 8. The method according to claim 1, wherein execution of the delayreduces the risk of instability arising from the removal of the group oftests.
 9. A method for providing an indication to a test system tomodify an execution sequence of tests for testing an object on the testsystem; the tests include a group of tests that is a candidate forreplacement: comprising, by a computer system associated with the testsystem: while the tests are being executed by the test system accordingto the execution sequence, if it is determined that the group of testsis not to be executed, obtaining a delay related to the group of tests,and before the group of tests is executed, providing the indication tosaid test system to modify in real time the execution sequence of thetests for executing the delay instead of the group of tests.
 10. Themethod according to claim 9, wherein the at least one of the delay andthe group of tests is determined by the computer system based on one ormore rules.
 11. The method according to claim 9, wherein the delay isshorter than an execution duration of the group of tests relatedthereto.
 12. The method according to claim 9, wherein the delay is setto a default value.
 13. The method according to claim 9, wherein thedelay is set at least partly based on an input received by the computersystem.
 14. The method according to claim 9, wherein the delay is set atleast partly based on estimated settling time.
 15. The method accordingto any one of claim 9, wherein the delay is set at least partly based onthe execution duration of the group of tests.
 16. The method accordingto claim 9, wherein the delay is set at least partly based on propertiesof tests that precede said group of tests.
 17. The method according toclaim 9, wherein the delay is set at least partly based on historicalperformance of tests that follow after said group of tests.
 18. Themethod according to claim 9, wherein the delay is set at least partlybased on calibration data for the test system.
 19. The method accordingto claim 9, wherein the delay is set at least partly based on simulationdata.
 20. The method according to claim 9, further comprising: inresponse to said provision of indication, the test system executing thedelay instead of the group of tests.
 21. The method according to claim9, wherein the tests include at least one other group of tests that is acandidate for replacement, and wherein said indication to modify theexecution sequence is provided for executing at least one other delayinstead of the at least one other group of tests, wherein the at leastone other delay is related to the at least one other group of tests. 22.A method for providing an indication to a test system to modify anexecution sequence of tests for testing an object on the test system,the tests including a group of tests that is a candidate forreplacement: comprising, by a computer system associated with the testsystem: (i) obtaining the group of tests; (ii) receiving from the testsystem a first indication that a test flow is loaded; (iii) augmentingthe test flow by inserting the delay related to the group of tests forselectively executing either the delay or the group of tests andproviding the augmented test flow to the test system; (iv) while thetests are being executed by the test system according to the executionsequence, if it is determined that the group of tests is not to beexecuted, obtaining a delay related to the group of tests, and beforethe group of tests is executed, providing the indication to said testsystem to modify in real time the execution sequence of the tests forexecuting the delay instead of the group of tests.
 23. The methodaccording to claim 22, further comprising: in response to said provisionof indication, said test system executing said delay instead of saidgroup of tests.
 24. The method according to claim 22, wherein the testsinclude at least one other group of tests that is a candidate forreplacement, and wherein said augmentation of the test flow furtherincludes inserting at least one other delay related to the at least oneother group of tests for, with respect to any other delay and relatedother group of tests, selectively executing either the other delay orthe other group of tests.
 25. The method according to claim 24, whereinsaid indication to modify the execution sequence is provided forexecuting the at least one other delay instead of the at least one othergroup of tests.
 26. A computer system for providing an indication to atest system associated therewith to modify an execution sequence oftests for testing an object on the test system; the tests include agroup of tests that is a candidate for replacement, the computer systembeing configured to perform, including: while the tests are beingexecuted by the test system according to the execution sequence, if itis determined that the group of tests is not to be executed, obtaining adelay related to the group of tests, and before the group of tests isexecuted, providing the indication to said test system to modify in realtime the execution sequence of the tests for executing the delay insteadof the group of tests.
 27. The computer system according to claim 26,further comprising: in response to said provision of indication, saidtest system being configured to execute said delay instead of said groupof tests.
 28. The computer system according to claim 26, wherein thetests include at least one other group of tests that is a candidate forreplacement, and wherein said indication to modify the executionsequence is provided for executing at least one other delay instead ofthe at least one other group of tests, wherein the at least one otherdelay is related to the at least one other group of tests.
 29. Thecomputer system according to claim 26, wherein the test system isassociated with the computer system by utilizing an ApplicationProgramming Interface (API).
 30. The computer system according to claim29, being configured to provide said indication to the test systemthrough the API.
 31. The computer system according to claim 26, whereinthe computer system includes a first computer system and a proxycomputer system and wherein the test system is associated with thecomputer system by utilizing the Proxy computer system.
 32. The computersystem according to claim 31, wherein said first computer system beingconfigured to provide said indication to the test system through theproxy computer system.
 33. A computer system for providing an indicationto a test system associated therewith to modify an execution sequence oftests for testing an object on the test system; the tests include agroup of tests that is a candidate for replacement, the computer systembeing configured to perform, including: (i) obtaining the group oftests; (ii) receiving from the test system a first indication that atest flow is loaded; (iii) augmenting the test flow by inserting thedelay related to the group of tests for selectively executing either thedelay or the group of tests and providing the augmented test flow to thetest system; (iv) while the tests are being executed by the test systemaccording to the execution sequence, if it is determined that the groupof tests is not to be executed, obtaining a delay related to the groupof tests, and before the group of tests is executed, providing theindication to said test system to modify in real time the executionsequence of the tests for executing the delay instead of the group oftests.
 34. The computer system according to claim 33, further comprisingin response to said provision of indication, said test system beingconfigured to execute said delay instead of said group of tests.
 35. Thecomputer system according to claim 33, wherein the tests include atleast one other group of tests that are candidates for replacement, andwherein said augmentation of the test flow further includes inserting atleast one other delay related to the at least one other group of testsfor, with respect to any other delay and related other group of tests,selectively executing either the other delay or the other group oftests.
 36. The method according to claim 33, wherein said indication tomodify the execution sequence is provided for executing the at least oneother delay instead of the at least one other group of tests.
 37. Thecomputer system according to claim 33, wherein the test system isassociated with the computer system by utilizing an ApplicationProgramming Interface (API).
 38. The computer system according to claim37, being configured to receive said first indication from the testsystem and to provide said indication to the test system through theAPI.
 39. The computer system according to claim 33, wherein the computersystem includes a first computer system and a proxy computer system andwherein the test system is associated with the computer system byutilizing the Proxy computer system.
 40. The computer system accordingto claim 39, wherein said first computer system being configured toreceive said first indication from the test system through the proxycomputer system, and wherein said first computer system being configuredto provide said indication to the test system through the proxy computersystem.
 41. The computer system according to claim 33, being configuredto augment the test flow of the tests including specifying said delay asa slot.
 42. A computer program product comprising a non-transitorycomputer useable medium having computer readable program code embodiedtherein for providing an indication to a test system to modify anexecution sequence of tests for testing an object on the test system;the tests include a group of tests that is a candidate for replacementthe computer program product comprising: computer readable program codefor causing the computer system, while the tests are being executed bythe test system according to the execution sequence, if it is determinedthat the group of tests is not to be executed, obtaining a delay relatedto the group of tests, and before the group of tests is executed,providing the indication to said test system to modify in real time theexecution sequence of the tests for executing the delay instead of thegroup of tests.
 43. A computer program product comprising anon-transitory computer useable medium having computer readable programcode embodied therein for providing an indication to a test system tomodify an execution sequence of tests for testing an object on the testsystem; the tests include a group of tests that is a candidate forreplacement the computer program product comprising: computer readableprogram code for causing a computer system to obtain the group of tests;computer readable program code for causing a computer system to receivefrom the test system a first indication that a test flow is loaded;computer readable program code for causing a computer system to augmentthe test flow by inserting the delay related to the group of tests forselectively executing either the delay or the group of tests andproviding the augmented test flow to the test system; computer readableprogram code for causing the computer system, while the tests are beingexecuted by the test system according to the execution sequence, if itis determined that the group of tests is not to be executed, obtaining adelay related to the group of tests, and before the group of tests isexecuted, providing the indication to said test system to modify in realtime the execution sequence of the tests for executing the delay insteadof the group of tests.